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Coupled DAE Problems

A circuit (DAE model) coupled to a magnetostatic field device (PDE model)

Coupled Problems of differential-algebraic equations (DAEs) arise typically from either multiphysical modeling (e.g. in circuit simulation with heating) or from refined modeling, where crucial parts of the original problem are replaced by a better, but computational more expensive model (e.g. circuits refined by field models). Furthermore splitting methods may turn a monolithic DAE problem into coupled subproblems, e.g. because of different time scales (multirate). In any case the DAEs arise from network approaches or space-discretization of PDAEs (Partial Differential Algebraic Equations).

Often the coupled equations have quite different properties, i.e., symmetries, definiteness or time scales. Thus the coupled system must be analyzed (e.g. the index) and tailored methods have to be developed (e.g. dynamic iteration).

Publications

Referenzen
47.
M. Günther; A. Bartel; B. Jacob; T. Reis
Dynamic iteration schemes and port-Hamiltonian formulation in coupled DAE circuit simulation
2020

Schlüsselwörter: math.NA, cs.NA, math.DS, math.OC, 34A09, 37J05, 65L80, 94C05, 94C15

46.
Nanoelectronic Coupled Problems Solutions
ter Maten, E. J. W. and Brachtendorf, H.-G. and Pulch, R. and Schoenmaker, W. and De Gersem, H., Autoren, Band 29 aus Mathematics in Industry
Herausgeber: Springer-Verlag GmbH,
2019
45.
S. Schöps; D. J. D. Guerra; H. De Gersem; A. Bartel; M. Günther; R. Pulch
Non-Intrusive Methods for the Cosimulation of Coupled Problems
Mathematics in Industry
Seite 131--159.
Herausgeber: Springer International Publishing,
2019
44.
P. Putek; R. Janssen; J. Niehof; E. J. W. ter Maten; R. Pulch; B. Tasić; M. Günther
Nanoelectronic COupled Problems Solutions: uncertainty quantification for analysis and optimization of an RFIC interference problem
Journal of Mathematics in Industry, 8 (1):1-22
2018
43.
C. Hachtel; J. Kerler-Back; A. Bartel; M. Günther; T. Stykel
Multirate DAE/ODE-Simulation and Model Order Reduction for Coupled Field-Circuit Systems
Scientific Computing in Electrical Engineering
Seite 91--100.
Herausgeber: Springer International Publishing,
2018
42.
R. Pulch; P. Putek; ter Maten E.J.W.; W. Schoenmaker
IX: Uncertainty Quantification: Introduction and Implementations
ter Maten, E. J. W. and Brachtendorf H., G. and Pulch, R. and Schoenmaker, W., Autoren, Nanoelectronic Coupled Problems Solutions
Seite 195--216.
Herausgeber: Springer,
2018
41.
R. Pulch; P. Putek; H. de Gersem; R. Gillon
XII: Inverse Modeling: Glue-Package-Die Problem
ter Maten, J. and Brachtendorf H., G. and Pulch, R. and Schoenmaker, W., Autoren, Nanoelectronic Coupled Problems Solutions
Seite 261--271.
Herausgeber: Springer,
2018
40.
P. Putek; R. Janssen; J. Niehof; E. J. W. ter Maten; R. Pulch; B. Tasić; M. Günther
Nanoelectronic Coupled Problems Solutions: Uncertainty quantification of RFIC interference
Quintela, P. and Barral, P. and Gómez, D. and Pena, F. J. and Rodríguez, J. and Salgado, P. and Vázquez-Mendéz, M. E., Autoren, Progress in Industrial Mathematics at ECMI 2016 Band 26 aus Mathematics in Industry
Seite 271--279.
Herausgeber: Springer,
2018
39.
R. Pulch; A. Bartel; S. Schöps
Quadrature methods with adjusted grids for stochastic models of coupled problems
Russo, G. and Capasso, V. and Nicosia, G. and Romano, V., Autoren, Progress in Industrial Mathematics at ECMI 2014 Band 22 aus Mathematics in Industry
Herausgeber: Springer,
2017
38.
E. J. W. ter Maten; P. A. Putek; M. Günther; R. Pulch; C. Tischendorf; C. Strohm; W. Schoenmaker; P. Meuris; B. De Smedt; P. Benner; L. Feng; N. Banagaaya; Y. Yue; R. Janssen; J. J. Dohmen; B. Tasić; F. Deleu; R. Gillon; A. Wieers; H.-G. Brachtendorf; K. Bittner; T. Kratochvíl; J. Petřzela; R. Sotner; T. Götthans; J. Dřínovský; S. Schöps; D. J. D. Guerra; T. Casper; H. De Gersem; U. Römer; P. Reynier; P. Barroul; D. Masliah; B. Rousseau
Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation
Journal of Mathematics in Industry, 7(1)
2016
37.
K. Gausling; A. Bartel
Coupling Interfaces and their Impact in Field/Circuit Co-Simulation
IEEE Trans. Magn., 52(3):1--4
2016
36.
K. Gausling; A. Bartel
Coupling Interfaces and Their Impact in Field/Circuit Co-Simulation
IEEE Trans. Magn., 52(3):1--4
2016
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